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author_facet:"Celano, Umberto"
dewey-ones:"543 - Analytical chemistry"
product_txtF_mv:"Springer eBooks 2005-"
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Metrology and Physical Mechanisms in New Generation Ionic Devices
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Celano, Umberto
Published 2016
Springer International Publishing
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Electrical Atomic Force Microscopy for Nanoelectronics
Published 2019
Springer International Publishing
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